Abstract: Line edge roughness (LER) is an undesirable phenomenon that arises during semiconductor fabrication processes, causing fluctuations in the characteristics of semiconductor devices and ...
Abstract: In this work, we present a numerical study of 1D and 2D closely spaced antenna arrays of microstrip dipole antennas covered by a metasurface in order to properly cloak and decouple the ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results