This new whitepaper explores how advanced cross-sectional analysis of battery electrodes - using scanning electron microscopy (SEM) and broad ion beam (BIB) milling - is enabling researchers and ...
A team of researchers at the University of Victoria (UVic) have achieved a major breakthrough in electron microscopy that will allow scientists to visualize atomic-scale structures with unprecedented ...
As the development of contemporary materials has continued to advance from the macro scale to nanoscale, the requirement for sophisticated microscopy techniques has increased dramatically. Scanning ...
When studying biological systems, understanding structure and chemistry often calls for different approaches. Scanning electron microscopy (SEM) is particularly useful for revealing ultrastructural ...
The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...
In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
When preparing cross sections, the standard procedure using the FIB-SEM technique is the use of high currents to quickly remove material, then lower the FIB current for an improved beam profile and ...
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Electron microscope technique achieves sub-Ångström resolution with lower cost and energy
A team of researchers at the University of Victoria (UVic) have achieved an advance in electron microscopy that will allow scientists to visualize atomic-scale structures with unprecedented clarity ...
What is Electron Backscatter Diffraction (EBSD)? Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD), is a powerful characterization technique used to analyze ...
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