Today’s high power semiconductor test applications are increasingly demanding, requiring test instrumentation capable of characterizing higher rated voltages and peak currents than ever before. Many ...

Testing of battery cells is frequently performed on fairly large groups of cells at the same time. Before testing can begin, the cells must be properly connected to the test equipment. For cells in a ...

In-circuit test (ICT) is a time-tested and proven method of testing PCBs. During ICT, a bed-of-nails fixture provides test-instrument access to PCB nodes. Each nail is positioned such that, when the ...

Folks from [Adafruit] are showing off a neat hack – USB host on RP2040, using the now-famous PIO peripheral. [Adafruit] builds a lot of RP2040 boards, and naturally, you gotta test them before you ...

The August print issue of EE-Evaluation Engineering includes a special report on power electronics test. In preparation for that article, we asked test equipment vendors to provide information on ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...