Semiconductor process engineers would love to develop successful process recipes without the guesswork of repeated wafer testing. Unfortunately, developing a successful process can’t be done without ...
Reducing back-end-of-line (BEOL) interconnect parasitic capacitance remains a focus for advanced technology node development. Porous low-k dielectric materials have been used to achieve reduced ...
Scientists have created an unprecedented 3-dimensional structural model of a key molecular "machine" known as the BAF complex, which modifies DNA architecture and is frequently mutated in cancer and ...
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