Figure 1. Comparison between conventional imaging using an imaging system (left) and “diffractive imaging” (right). In both cases, the sample needs to be illuminated by EUV light. However, the ...

Hidden semiconductor defects often pass inspection but fail later in operation. Learn how latent defects form, evade detection, and drive long-term reliability failures.

Today's systematic and more subtle random defects are not only decreasing yields, but are also increasing the number of test escapes, or defective parts per million (DPPM) shipped out. One of the ...

Scientists from the University of Basel claim to have identified the causes of low near-interface mobility in the silicon carbides (SiCs) used in power electronics. With the Evidence for carbon ...

The U.S. Consumer Product Safety Commission ("CPSC" or the "Commission") is the regulatory agency responsible for protecting the public from unreasonable risks of injury and death associated with ...

Tokyo, Japan – Scientists from Tokyo Metropolitan University have used machine learning to automate the identification of defects in sister chromatid cohesion. They trained a convolutional neural ...

One of the biggest challenges for non-AI experts is the terminology. Artificial intelligence, machine learning (ML), and computer vision (CV) are frequently discussed, but people outside of data ...