Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

HAWTHORNE, N.Y., July 17, 2020 /PRNewswire/ -- SEMICON West 2020 – Microtronic, maker of high-speed full-wafer macro defect inspection systems and software, has just announced an innovative new way to ...

In the world of embedded software development, defects can cripple projects, delay releases, and ultimately lead to failures that affect everything from consumer electronics to mission-critical ...

Discover the top 7 test management software solutions for DevOps teams in 2025. Learn how these tools can enhance your testing processes, integrate with CI/CD pipelines, and improve software delivery ...

In today's market, businesses need to move quickly, deliver seamless digital experiences and build trust with users. In the face of these demands, software testing has evolved from a necessary process ...