At-speed testing and delay defect analysis have become increasingly critical in ensuring the reliability and performance of modern integrated circuits. As circuit complexity grows alongside rapid ...
MILPITAS, Calif., Dec. 10, 2020 /PRNewswire/ -- Today KLA Corporation (NASDAQ: KLAC) announced two new products: the PWG5™ wafer geometry system and the Surfscan® SP7XP wafer defect inspection system.
Venice, Florida — The latest integrated circuit manufacturing process advances have significantly increased the number of gates on an IC, and test pattern sizes continue to grow as a result. In ...
A technical paper titled “In situ electrical property quantification of memory devices by modulated electron microscopy” was published by researchers at Hitachi High-Tech Corporation, KIOXIA ...
Siemens today announced it has acquired ASTER Technologies ("ASTER"), a privately held market leader in printed circuit board ...
According to Siemens, the acquisition will allow it to integrate Aster's circuit-testing capabilities into its own portfolio.
A project at MIT has developed a process to integrate atomic-scale defects located in thin slices of diamond, so called "artificial atoms," into photonic circuitry on a larger scale than previously ...
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