Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
Classification and Localization of Semiconductor Defect Classes in Aggressive Pitches (imec, Screen)
A new technical paper titled “An Evaluation of Continual Learning for Advanced Node Semiconductor Defect Inspection” was published by Imec and SCREEN SPE Germany. “Deep learning-based semiconductor ...
Whether the discussion is about smart manufacturing or digital transformation, one of the biggest conversations in the semiconductor industry today centers on the tremendous amount of data fabs ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback