Functional polymer thin films possess many technological applications ranging from optoelectronics to sensors. Their flexibility, tunable properties, and low-cost preparation make them very appealing ...

Infrared (IR) spectroscopy is one of the most accepted analytical measurement methods for the characterization of materials in government, academic, and industrial R&D laboratories. The spatial ...

A major advantage of atomic force microscopes (AFMs) is their versatility in integrating various operational modes that assess different material properties and functionalities. Among the most ...

The exceptional properties of 2D materials for important applications in semiconductors, battery technology, photovoltaics, and several other fields render them a key developing area of research.

Conductive atomic force microscopy (C-AFM) is a powerful nanoscale characterization technique that combines the high-resolution imaging capabilities of atomic force microscopy (AFM) with the ability ...